| 1. | Specification for solderability tester by solder bath method
焊槽法可焊性测试仪.技术条件 |
| 2. | Semiconductor devices - mechanical and climatic test methods - rapid change of temperature - two - fluid - bath method
半导体装置.机械和气候试验方法.温度速变.双流体浸泡法 |
| 3. | Petroleum products . measurement of the viscosity at low temperatures using a brookfield viscosity meter . liquid bath method
石油产品.用布鲁克菲尔德粘度计测量低温粘度.液浴法 |
| 4. | Testing of lubricants ; procedure for measurement of low temperature apparent viscosity by means of the brookfield viscometer liquid bath method
润滑剂试验用brookfield粘度计测定低温表观粘度 |
| 5. | Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method
半导体器件.机械和气候试验方法.第11部分:温度的急速变化.双液电镀槽法 |
| 6. | Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature - two - fluid - bath method
半导体装置.机械和气候试验方法.第11部分:温度的急速变化.双液电镀槽法 |
| 7. | Is applied for articles which are rough to handle after the bath method . for this procedure a special ventilation is highly recommended
应用于同浴法洗涤后引起手感粗糙的情况，在这种情况下使用应尽量保持良好的通风。 |
| 8. | Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method iec 60749 - 11 : 2002 ; german version en 60749 - 11 : 2002
半导体器件.机械和气候试验方法.第11部分:温度骤变 |
| 9. | Sem results imply that the surface of thin films deposited by chemical bath method is correlate to the reaction conditions . surface of sns thin films deposited by chemical bath method are coarse than thin films deposited by chemical bath with ultrasonication method and successive ionic layer adsorption and reaction method
Sem结果显示用常规化学浴方法所制备的薄膜样品的表面形貌与反应条件有关，而用超声波辅助化学浴和连续离子反应法制备的薄膜样品的表面较之常规化学浴方法所得到的薄膜样品表面晶粒细小均匀，致密平整。 |
